ATOMIC FORCE MICROSCOPE (AFM)

Atomic force microscopy (AFM) not only provides access to surface topography on the nanoscale, but also probes its mechanical properties (Young's modulus, adhesion, friction). While optical microscopy is the extension of the researcher's eye, AFM is the extension of their hand. The JPK NanoWizard II and Bruker Catalyst models available at Restore are coupled with inverted epi-fluorescence optical microscopes, making it possible to correlate these different sources of information on scans measuring up to 120 µm per side. Specifically designed to work in liquid medium and at controlled temperature, these instruments are suitable both for the study of living cells and tissues and for probing matter at the molecular scale, and can thus highlight the mechanical (adhesion, stiffness, friction, etc.) and topographical (height, width, roughness, etc.) properties of the compounds studied.